Researches
| Forensic Science | |||||
|---|---|---|---|---|---|
| Researcher Name | Research Title | Journal Title | Publish Year | Vol. No. | |
| - Prof.Dr. Alaa Jabbar Ghazai | Characterization of surface roughness of Pt Schottky contacts on quaternary n-AlInGaN thin film assessed by atomic force microscopy and fractal analysis. | Journal of Materials Science: Materials in Electronics | 2014 | 25 | |
| - Prof.Dr. Alaa Jabbar Ghazai | Performance characteristics of deep violet InGaN DQW laser diodes with InGaN/GaN superlattice waveguide layers | Optik | 2014 | 125 | |
| - Prof.Dr. Alaa Jabbar Ghazai | Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al 0.08 In 0.08 Ga 0.84 N thin film assessed by atomic force microscopy and fractal analysis | Journal of Materials Science: Materials in Electronics | 2014 | 25 | |
| - Prof.Dr. Alaa Jabbar Ghazai | Measurement of Deby length By using single probe technique | University of Thi-Qar Journal of Science | 2014 | 4 | |
| - Prof.Dr. Alaa Jabbar Ghazai | Comparison of the structural and optical properties of porous In0. 08Ga0. 92N thin films synthesized by electrochemical etching | Journal of Solid State Chemistry | 2014 | 212 | |
| - Prof.Dr. Alaa Jabbar Ghazai | Structural and optical investigations of In doped ZnO binary compound | Materials Express | 2014 | 4 | |
| - Prof.Dr. Alaa Jabbar Ghazai | Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al^ sub 0.08^ In^ sub 0.08^ Ga^ sub 0.84^ N thin film assessed by atomic force microscopy and … | Journal of Materials Science. Materials in Electronics | 2014 | 25 | |
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